Bibliografische Daten
ISBN/EAN: 9781493947027
Sprache: Englisch
Umfang: xiii, 424 S., 338 s/w Illustr., 424 p. 338 illus.
Einband: kartoniertes Buch
Beschreibung
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
Produktsicherheitsverordnung
Hersteller:
Springer Verlag GmbH
juergen.hartmann@springer.com
Tiergartenstr. 17
DE 69121 Heidelberg
Autorenportrait
Manjul Bhushan is a technical consultant in New York.Mark Ketchen is a technical consultant in Massachusetts.
